advantest 93k tester manual pdf

0000007267 00000 n 0000012694 00000 n ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. 0000085770 00000 n This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. 0000031694 00000 n Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. 0000017827 00000 n Click on more information for further details. DUT boards can be exchanged, as well as test programs. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. 0000057829 00000 n Calibration, test flow, test methods, debbuging tools, and concepts. 0000003026 00000 n Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. 0000005901 00000 n Engineering time is reduced through test program reuse. 0000016567 00000 n E-mail Admin : saprjo@yahoo.com. The result: excellent mechanical and electrical contact is assured. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. Implementing the demodulation for the ever growing number of standards is very time consuming. . trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream 0000010927 00000 n In the past, RF parts were separate, individual "jelly bean" parts. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. 0000061569 00000 n ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' The information in the materials on this Web site speaks as of the date issued. 0000006289 00000 n For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Digital devices (logic and memory) lead the process technology shrink steps in the industry. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. TSE: 6857. All features and performance points are available in all classes. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. 0000332614 00000 n SOC ATE . 0000079887 00000 n Digital devices (logic and memory) lead the process technology shrink steps in the industry. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. 0000009606 00000 n Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. 0000014447 00000 n ProgramGenerator. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. V93000 Visionary and Enduring Architecture. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. 0000013644 00000 n 0000160939 00000 n 0000059091 00000 n ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. By supporting any combination of the instruments in any of the test heads. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. 0000058497 00000 n The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. 0000349795 00000 n 0000180605 00000 n Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. Key concepts and components of the V93000. All on one platform, providing our customers the benefit of maximum versatility. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications . Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. Auto Loading / Unloading Feature for Manual Equipment . For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Universal Analog Pin covers widest application range. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. 0000058694 00000 n HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Reducing loadboard complexity in Power Applications. With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. After completion the student will be familiar with the following: Advantest Corporation The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. TSE: 6857. 0000321810 00000 n V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. 0000029728 00000 n Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Training needs are limited due to a single, familiar test system. Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. View and Download Advantest instruction manual online. 0000058601 00000 n It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. 0000062394 00000 n Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. %PDF-1.4 % 0000006781 00000 n (Cut outs impact deflection/rigidity properties). ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Maximum Investment Protection and Flexibility, Advantest Corporation Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. 0000061958 00000 n With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. 0000006892 00000 n The platform has become the all purpose reference platform. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. Founded in Tokyo in 1954, Advantest is a global company with facilities. Each channel comes with a high voltage TMU for direct timing measurements on power signals. The platform has become the all purpose reference platform. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. A test program verification tool suite . TSE: 6857. Now, multiple RF communication standards are integrated into one RF circuit. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . 0000015761 00000 n Advantest. Satuan Pengawas Internal UHO 2021. 0000011255 00000 n 0000014977 00000 n PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. FEb2 Additional time to market improvements are achieved through the single scalable platform. Theme by spirit halloween lol costume. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. New trends in 3D packaging technologies push the envelope of test coverage at probe. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. 0000080030 00000 n The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. E-mail Kantor : spiuho@uho.ac.id 0000002125 00000 n With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. User-specific tests are programmed with test methods in C. Links are . ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. TEAM A.T.E. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. For people with basic SOC testing knowledge (e.g. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. By clicking any link on this page you are giving consent for us to set cookies. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 0000010551 00000 n Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. For Simulation to ATEand. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 0000059144 00000 n ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. Release 5.4.3. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. The user benefits are reduced test time, best repeatability and simplified program creation. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. 0000009007 00000 n 3DIC test software development, integration and maintenance. 0000007336 00000 n By clicking any link on this page you are giving consent for us to set cookies. orient road jail inmate search, frank gerstle cause of death, does marvin die after falsettos, how to fill out a personal representative deed colorado, what's open in mexico city on christmas day, dog limping 1 year after tta surgery, jane martin hamner obituary, commissioners office baltimore county, how to cash a $1,000 lottery ticket in massachusetts, reading phillies buffet, verses upon the burning of our house metaphor, ball handling in netball catching whilst stationary, best places to live in south carolina mountains, heartland actor, dies of covid, stuc a' chroin death,

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